{"id":8392,"date":"2023-12-12T10:11:39","date_gmt":"2023-12-12T09:11:39","guid":{"rendered":"https:\/\/iel.lukasiewicz.gov.pl\/mikroskopia-en\/"},"modified":"2024-08-16T10:21:58","modified_gmt":"2024-08-16T08:21:58","slug":"mikroskopia-en","status":"publish","type":"page","link":"https:\/\/iel.lukasiewicz.gov.pl\/en\/mikroskopia-en\/","title":{"rendered":"Mikroskopia en"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"8392\" class=\"elementor elementor-8392 elementor-4998\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-7a09bae elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"7a09bae\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-f2a2cc0\" data-id=\"f2a2cc0\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-7c9241ec elementor-widget elementor-widget-heading\" data-id=\"7c9241ec\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<p class=\"elementor-heading-title elementor-size-small\">technologies<\/p>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-6e1882e4 elementor-widget elementor-widget-heading\" data-id=\"6e1882e4\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<p class=\"elementor-heading-title elementor-size-small\">Microscopic imaging techniques\n<\/p>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-dcb3e98 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"dcb3e98\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-90f1296\" data-id=\"90f1296\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-5bebf8c elementor-widget elementor-widget-spacer\" data-id=\"5bebf8c\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-82df2ec elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"82df2ec\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-dcd59ec cut-off-wrapper-95\" data-id=\"dcd59ec\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-68cd602 elementor-widget elementor-widget-text-editor\" data-id=\"68cd602\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>VEGA\/SBH Tescan + EDS INCA PentaFET x3 Oxford Instruments<\/strong><\/p>\n<p>In scanning electron microscopy (SEM), scanning is performed using a focused beam of electrons that interact with atoms on the surface of the sample. The SE detector collects secondary electrons that allow imaging of details of the sample surface topography. The BSE detector detects backscattered electrons so that phase contrast can be obtained. The X-rays emitted when the sample is bombarded with an electron beam are collected by an EDS detector. This allows the elemental composition of the sample to be analysed.    <\/p>\n<p>The SEM technology allows detailed analysis of the sample surface topography and composition. Conductive samples can be measured without prior preparation. A metallic conductive layer must first be sputtered or vapourised onto samples that are not conductive.  <\/p>\n<p><strong>diInnova Bruker<\/strong><\/p>\n<p>Atomic force microscopy is based on the measurement of local interactions (including van der Waals, electrostatic, magnetic, capillary or ionic repulsion) between the scanning blade and the sample. The measured value is the magnitude of the deflection of the beam with the blade or the amplitude of the probe oscillation. The method of measurement allows the detection of different types of interactions on the sample surface and visualisation in the form of a distribution map.  <\/p>\n<p>Measuring capability: topography (roughness), force spectroscopy, lateral forces, phase shift, force-modulated microscopy (FMM), nanoscratching, nanoindentation, Kelvin probe force microscopy (KPFM), electrostatic force microscopy (EFM), scanning tunneling microscopy (STM). The AFM microscopy can be used, among other things, to determine local mechanical properties, analyse roughness or determine coating thickness.  <\/p>\n<p><strong>Nikon Eclipse MA200<\/strong><\/p>\n<p>Optical metallographic microscopy with both brigh tfield and dark field measurement capabilities and Nomarski contrast. The Nomarski differential interference contrast method DIC enables analysis of sample surface topography with nanometre-scale irregularities, makes structures with different refractive indices visible and causes a chiaroscuro effect on the image and an impression of its spatiality. Magnification ranges available include 5, 10, 20, 50 and 100\u00d7.  <\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<section class=\"elementor-section elementor-inner-section elementor-element elementor-element-771574f elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"771574f\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-inner-column elementor-element elementor-element-870ad7f\" data-id=\"870ad7f\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-6ce91c6 elementor-widget elementor-widget-image\" data-id=\"6ce91c6\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<figure class=\"wp-caption\">\n\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"700\" height=\"700\" src=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_1a.png\" class=\"attachment-full size-full wp-image-7042\" alt=\"\" srcset=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_1a.png 700w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_1a-300x300.png 300w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_1a-150x150.png 150w\" sizes=\"(max-width: 700px) 100vw, 700px\" \/>\t\t\t\t\t\t\t\t\t\t\t<figcaption class=\"widget-image-caption wp-caption-text\">SME microscopy image of corrosion products, SE detector image, magnification 1300\u00d7<\/figcaption>\n\t\t\t\t\t\t\t\t\t\t<\/figure>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-inner-column elementor-element elementor-element-df657e5\" data-id=\"df657e5\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-f67eb02 elementor-widget elementor-widget-image\" data-id=\"f67eb02\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<figure class=\"wp-caption\">\n\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"700\" height=\"700\" src=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_2a.png\" class=\"attachment-full size-full wp-image-7044\" alt=\"\" srcset=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_2a.png 700w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_2a-300x300.png 300w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_2a-150x150.png 150w\" sizes=\"(max-width: 700px) 100vw, 700px\" \/>\t\t\t\t\t\t\t\t\t\t\t<figcaption class=\"widget-image-caption wp-caption-text\">3D image of a nanotube agglomerate from an AFM microscope<\/figcaption>\n\t\t\t\t\t\t\t\t\t\t<\/figure>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-inner-column elementor-element elementor-element-58cac77\" data-id=\"58cac77\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-bb87caa elementor-widget elementor-widget-image\" data-id=\"bb87caa\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<figure class=\"wp-caption\">\n\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"700\" height=\"700\" src=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_3a.png\" class=\"attachment-full size-full wp-image-7046\" alt=\"\" srcset=\"https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_3a.png 700w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_3a-300x300.png 300w, https:\/\/iel.lukasiewicz.gov.pl\/wp-content\/uploads\/sites\/24\/2024\/02\/mikroskopia_3a-150x150.png 150w\" sizes=\"(max-width: 700px) 100vw, 700px\" \/>\t\t\t\t\t\t\t\t\t\t\t<figcaption class=\"widget-image-caption wp-caption-text\">Composite sample as seen by dark field optical microscopy, 100 \u00b5m scale<\/figcaption>\n\t\t\t\t\t\t\t\t\t\t<\/figure>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>\/*! elementor &#8211; v3.21.0 &#8211; 26-05-2024 *\/ .elementor-heading-title{padding:0;margin:0;line-height:1}.elementor-widget-heading .elementor-heading-title[class*=elementor-size-]&gt;a{color:inherit;font-size:inherit;line-height:inherit}.elementor-widget-heading .elementor-heading-title.elementor-size-small{font-size:15px}.elementor-widget-heading .elementor-heading-title.elementor-size-medium{font-size:19px}.elementor-widget-heading .elementor-heading-title.elementor-size-large{font-size:29px}.elementor-widget-heading .elementor-heading-title.elementor-size-xl{font-size:39px}.elementor-widget-heading .elementor-heading-title.elementor-size-xxl{font-size:59px} technologies Microscopic imaging techniques \/*! elementor &#8211; v3.21.0 &#8211; 26-05-2024 *\/ .elementor-column 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.elementor-widget-empty-icon,.e-con&gt;.elementor-widget-spacer.elementor-widget-empty .elementor-widget-empty-icon{position:absolute;top:0;bottom:0;left:0;right:0;margin:auto;padding:0;width:22px;height:22px} VEGA\/SBH Tescan + EDS INCA PentaFET x3 Oxford Instruments In scanning electron microscopy (SEM), scanning is performed using a focused beam of electrons that interact with [&hellip;]<\/p>\n","protected":false},"author":135,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_seopress_robots_primary_cat":"","_seopress_titles_title":"","_seopress_titles_desc":"","_seopress_robots_index":"","inline_featured_image":false,"footnotes":""},"class_list":["post-8392","page","type-page","status-publish","hentry"],"acf":[],"publishpress_future_action":{"enabled":false,"date":"2026-04-07 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